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The Maxim Integrated MAX9977AKCCQ+D, now documented by Analog Devices, is a quad low-power, high-speed pin-electronics driver for automated test equipment in a 100-pin TQFP with inverted exposed die pad.
Ordering code, channel architecture and electrical characteristics are taken from the MAX9977 manufacturer datasheet. Verify the exact board and thermal interface before design use.
MAX9977 integrates four independent three-level device-under-test drivers. Each channel supports high, low, active-termination and high-impedance operating states. Differential control inputs and a shared serial interface reduce external pin-electronics circuitry in medium-performance system-on-chip and memory test systems.
Integrates four device-under-test signal drivers in one package.
High and low drive levels plus active termination support ATE signaling patterns.
The family datasheet specifies 1200 Mbps at a 3 V peak-to-peak swing under its test conditions.
The AK variant provides internal control-input termination described in the datasheet.
Programmed low-leakage, high-impedance and tri-state/termination configurations.
A three-wire low-voltage CMOS-compatible interface configures operating modes.
High-speed data/control inputs are designed for compatible CML or LVDS-style signaling.
A TEMP monitor output supports system-level thermal management.
The manufacturer ordering table lists MAX9977AKCCQ+D in a 100-pin TQFP with an inverted exposed die pad; the database package is 100-TQFP Exposed Pad. The exposed pad is on the top for heat extraction. Check the manufacturer's C100E-8R drawing for land pattern, pad orientation and thermal assembly requirements.

The registered package JPG is not available on the production site. Its expected path is shown only for later verification; the manufacturer drawing controls mechanical design.
The manufacturer pin description groups the four channels and shared controls as follows:
Signal groups do not substitute for the datasheet's 100-pin map. Verify exact pin numbers, polarities and bypassing before PCB routing.
| Exact order code | MAX9977AKCCQ+D |
|---|---|
| Documented manufacturer | Maxim Integrated; technical documentation hosted by Analog Devices |
| Function | Quad ATE pin-electronics driver |
| Driver channels | Four |
| Output modes | High, low, active termination and high impedance |
| Data rate | 1200 Mbps at 3 V peak-to-peak swing, datasheet conditions |
| Driver voltage range | -1.5 V to +6.5 V operating range, per datasheet |
| Power per channel | 0.8 W maximum stated by manufacturer |
| Control input termination | Internal 50 ohm differential-control termination for AK variant |
| Ordering temperature range | 0 to +70 degrees Celsius ambient |
| Package | 100-pin TQFP, inverted exposed die pad, C100E-8R |
| Supply and thermal validation | Use full electrical and die-temperature tables for design limits |
Performance figures carry the manufacturer's specified test conditions and are not unconditional limits for every board configuration.
Do not replace the AK variant with the AD version without checking control-input termination. For any substitute, compare four-channel topology, level range, interface, timing, exposed-pad orientation, thermal path and exact pin map. The manufacturer's pin-compatibility statement for related MAX9963/MAX9965 drivers does not establish functional or timing equivalence for every board.
No internal catalog alternative is linked because an exact product-and-package match has not been verified through the product API.
The database identifies Analog Devices Inc./Maxim Integrated. The MAX9977 datasheet was issued by Maxim Integrated and is now hosted by Analog Devices. Its ordering table explicitly lists MAX9977AKCCQ+D as the lead-free AK option in the 100-pin TQFP inverted-die-pad package.
High-speed pin electronics for digital test channels.
Programmable drive and termination at device-under-test connections.
Four drivers per device support dense test-board layouts.
Identification and qualification of original MAX9977 board positions.
Confirm the full top marking, lead-free suffix, package outline, exposed-pad construction and traceability for each supplied lot. Inspect lead condition and thermal interface and perform electrical acceptance testing appropriate to the test platform.
It is a four-channel, three-level driver for automated test equipment.
The manufacturer's ordering table specifies a 100-pin TQFP with inverted exposed die pad, variation C100E-8R.
Yes. The manufacturer distinguishes it from the AD variant, which omits the internal termination.
No. The expected production JPG is unavailable, so use the controlled package drawing.
Before design-in or replacement, verify the complete ordering code, C100E-8R package drawing, inverted-pad thermal interface, pin assignments, differential control levels, power limits and speed test conditions against the manufacturer datasheet. The production package JPG is missing, so this draft must remain under review until the asset and rendering are verified.
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