Unit Price:$0
Ext Price:$0



| Image | ![]() |
![]() |
![]() |
![]() |
|
| Part Number | BAV199,215 | BAV199,235 | BAV199W,115 | BAV199-QR | BAV199S-QZ |
| Manufacturer | Nexperia USA Inc. | Nexperia USA Inc. | Nexperia USA Inc. | Nexperia USA Inc. | Nexperia USA Inc. |
| Series | - | - | - | - | - |
| Package/Case | TO-236-3, SC-59, SOT-23-3 | TO-236-3, SC-59, SOT-23-3 | SC-70, SOT-323 | TO-236-3, SC-59, SOT-23-3 | 6-TSSOP, SC-88, SOT-363 |
| Packaging | Tape & Reel (TR) | Tape & Reel (TR) | Tape & Reel (TR) | Tape & Reel (TR) | Tape & Reel (TR) |
| Product Status | Active | Active | Active | Active | Active |
| Diode Configuration | 1 Pair Series Connection | 1 Pair Series Connection | 1 Pair Series Connection | 1 Pair Series Connection | 2 Pair Series Connection |
| Technology | Standard | Standard | Standard | Standard | Standard |
| Voltage - DC Reverse (Vr) (Max) | 75 V | 75 V | 75 V | 75 V | 75 V |
| Current - Average Rectified (Io) (per Diode) | 160mA (DC) | 160mA (DC) | 110mA (DC) | 140mA | 215mA (DC) |
| Voltage - Forward (Vf) (Max) @ If | 1.25 V @ 150 mA | 1.25 V @ 150 mA | 1.1 V @ 50 mA | 1.1 V @ 50 mA | 1.25 V @ 150 mA |
| Speed | Small Signal =< 200mA (Io), Any Speed | Small Signal =< 200mA (Io), Any Speed | Small Signal =< 200mA (Io), Any Speed | Small Signal =< 200mA (Io), Any Speed | Standard Recovery >500ns, > 200mA (Io) |
| Reverse Recovery Time (trr) | 3 µs | 3 µs | 3 µs | 3 µs | 3 µs |
| Current - Reverse Leakage @ Vr | 5 nA @ 75 V | 5 nA @ 75 V | 5 nA @ 75 V | 5 nA @ 75 V | 5 nA @ 75 V |
| Operating Temperature - Junction | 150°C (Max) | 150°C (Max) | 150°C (Max) | 150°C | 150°C |
| Grade | Automotive | - | - | Automotive | Automotive |
| Qualification | AEC-Q101 | - | - | AEC-Q101 | AEC-Q101 |
| Mounting Type | Surface Mount | Surface Mount | Surface Mount | Surface Mount | Surface Mount |
| Supplier Device Package | TO-236AB | TO-236AB | SOT-323 | TO-236AB | 6-TSSOP |
The following parts include "BAV199,215" in Silicon Labs BAV199,215.
The following parts are popular search parts in Test and Measurement.