Unit Price:$0
Ext Price:$0



| Image | ![]() |
![]() |
![]() |
![]() |
![]() |
| Part Number | MT53E768M32D4DE-046 WT:E | MT53E768M32D4DE-046 WT:E TR | MT53E768M32D4DE-046 AIT:E TR | MT53E768M32D4DE-046 AIT:E | MT53E768M32D4DE-046 AAT:E TR |
| Manufacturer | Micron Technology Inc. | Micron Technology Inc. | Micron Technology Inc. | Micron Technology Inc. | Micron Technology Inc. |
| Series | - | - | - | - | - |
| Package/Case | 200-TFBGA | 200-TFBGA | 200-TFBGA | 200-TFBGA | 200-TFBGA |
| Packaging | Bulk | Tape & Reel (TR) | Tape & Reel (TR) | Box | Tape & Reel (TR) |
| Product Status | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete |
| Programmable | Not Verified | Not Verified | Not Verified | Not Verified | - |
| Memory Type | Volatile | Volatile | Volatile | Volatile | Volatile |
| Memory Format | DRAM | DRAM | DRAM | DRAM | DRAM |
| Technology | SDRAM - Mobile LPDDR4 | SDRAM - Mobile LPDDR4 | SDRAM - Mobile LPDDR4X | SDRAM - Mobile LPDDR4X | SDRAM - Mobile LPDDR4X |
| Memory Size | 24Gbit | 24Gbit | 24Gbit | 24Gbit | 24Gbit |
| Memory Organization | 768M x 32 | 768M x 32 | 768M x 32 | 768M x 32 | 768M x 32 |
| Memory Interface | Parallel | Parallel | LVSTL | LVSTL | LVSTL |
| Clock Frequency | 2.133 GHz | 2.133 GHz | 2.133 GHz | 2.133 GHz | 2.133 GHz |
| Write Cycle Time - Word, Page | 18ns | 18ns | 18ns | 18ns | 18ns |
| Access Time | 3.5 ns | 3.5 ns | 3.5 ns | 3.5 ns | 3.5 ns |
| Voltage - Supply | 1.06V ~ 1.17V | 1.06V ~ 1.17V | 1.06V ~ 1.17V | 1.06V ~ 1.17V | 1.06V ~ 1.17V |
| Operating Temperature | -25°C ~ 85°C | -25°C ~ 85°C | -40°C ~ 95°C (TC) | -40°C ~ 95°C (TC) | -40°C ~ 105°C (TC) |
| Grade | - | - | - | - | Automotive |
| Qualification | - | - | - | - | AEC-Q100 |
| Mounting Type | Surface Mount | Surface Mount | Surface Mount | Surface Mount | Surface Mount |
| Supplier Device Package | 200-TFBGA (10x14.5) | 200-TFBGA (10x14.5) | 200-TFBGA (10x14.5) | 200-TFBGA (10x14.5) | 200-TFBGA (10x14.5) |
The following parts include "MT53E768M32D4DE-046 AIT:E" in Silicon Labs MT53E768M32D4DE-046 AIT:E.
The following parts are popular search parts in Test and Measurement.